A hierarchical approach to automatic test-pattern generation

E.C. Weening (Speaker)

    Activity: Talk or presentationOral presentation

    Description

    Plaats van uitgifte: Veldhoven
    Period29 Nov 1990
    Event titleFOM Werkgemeenschap Halfgeleiders 1990
    Event typeConference
    LocationVeldhoven, Netherlands

    Keywords

    • METIS-117332