A Method for Automatic Test Plan Generation for Functional Testing of Mixed-Signal Circuits

N. Engin (Keynote speaker), Kerkhoff, H. G. (Keynote speaker), R.J.W.T. Tangelder (Keynote speaker), H. Speek (Keynote speaker)

    Activity: Talk or presentationOral presentation


    Opmerking: Key-note speaker Plaats van uitgifte: Enschede, The Netherlands
    Period1 May 1997
    Event titleOral presentation ESPRIT Open Workshop
    Event typeConference
    LocationEnschede, The Netherlands


    • METIS-116474