A Real-Time Comparison Between sEMG Sequential Direct and Pattern Recognition Control.

J.S. Rietman (Examiner), Nizamis, K. (Examiner), van Beijnum, B. J. F. (Examiner)

    Activity: Examination

    Description

    Master Examination of Anil Ayvaz
    Period8 Mar 2018
    Examinee
    Examination held at
    Degree of RecognitionLocal