A Real-Time Comparison Between sEMG Sequential Direct and Pattern Recognition Control.

Rietman, J. S. (Examiner), Nizamis, K. (Examiner), van Beijnum, B. J. F. (Examiner)

Activity: Examination

Description

Master Examination of Anil Ayvaz
Period8 Mar 2018
ExamineeAnil Ayvaz
Examination held at
Degree of RecognitionLocal