AC loss test results of Nb3Sn CICCs with various cabling layouts
- Nijhuis, A. (Speaker)
- Tommaso Bagni (Speaker)
- K. Yagotyntsev (Speaker)
- Zhou, C. (Speaker)
- Valiyaparambil Abdulsalam Anvar (Speaker)
Activity: Talk or presentation › Invited talk
Activity: Talk or presentation › Invited talk