Advancing thin film X-ray reflectivity data analysis

Makhotkin, I. A. (Speaker), Sergey N. Yakunin (Contributor), J.F. Woitok (Contributor), van de Kruijs, R. W. E. (Contributor), Bijkerk, F. (Contributor)

Activity: Talk or presentationOral presentation

Period12 Dec 2018
Held atInternational MicroNanoConference, IMNC 2018
Event typeConference
LocationAmsterdam, Netherlands
Degree of RecognitionInternational