AHE Measurements of Nano-Sized dots and thin films

J.C. Lodder (Speaker)

    Activity: Talk or presentationOral presentation

    Description

    Plaats van uitgifte: Tohoku University, Sendai, Japan
    Period11 Dec 2003
    Event titleOral presentation at the RIEC
    Event typeConference
    LocationTohoku University, Sendai, Japan

    Keywords

    • METIS-219243