Capabilities of model free X-ray standing wave analysis of periodic multilayer structures

Makhotkin, I. A. (Speaker), S.N. Yakunin (Contributor), C.P. Hendrikx (Contributor), Chandrasekaran, A. (Contributor), Zameshin, A. (Contributor), A. Zarkadas (Contributor), M. Gateshki (Contributor), van de Kruijs, R. W. E. (Contributor), E. Reuvekamp (Contributor), Bijkerk, F. (Contributor)

Activity: Talk or presentationOral presentation


Development of state-of-the-art periodic multilayer structures, as used for instance in x-ray optics, requires advanced interface engineering.
Period22 May 2017
Event titleSymposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017
Event typeConference
LocationStrasbourg, France
Degree of RecognitionInternational