Capabilities of model free X-ray standing wave analysis of periodic multilayer structures

Activity: Talk or presentationOral presentation

Description

Development of state-of-the-art periodic multilayer structures, as used for instance in x-ray optics, requires advanced interface engineering.
Period22 May 2017
Event titleSymposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017
Event typeConference
LocationStrasbourg, France
Degree of RecognitionInternational