Characterization of organic ultrathin films by atomic force microscopy based techniques

Q. Shen (Speaker), G. Hlawacek (Speaker), M. kratzer (Speaker), A. Pavitschitz (Speaker), A. Lex (Speaker), G. Trimmel (Speaker), H.-G. Flesch (Speaker), T. Potocar (Speaker), T. Griesser (Speaker), R. Resel (Speaker), A. Winkler (Speaker), C. Teichert (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Sonderberg, Denmark
Period19 Apr 2010

Keywords

  • METIS-273918