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Combined electrical and morphological characterization of Al2O3 films by non-contact AFM
Sturm, J. M.
(Speaker)
A. Zinine (Speaker)
Wormeester, H.
(Speaker)
R.G. Bankras (Speaker)
J. Holleman (Speaker)
Schmitz, J.
(Speaker)
Poelsema, B.
(Speaker)
Physics of Interfaces and Nanomaterials
Activity
:
Talk or presentation
›
Oral presentation
Description
Plaats van uitgifte: Boston, USA
Period
30 Oct 2005
Event title
52nd AVS International Symposium & Exhibition 2005
Event type
Conference
Conference number
52
Location
Boston, United States, Massachusetts
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Keywords
METIS-227175
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