Combining AFM with Ellipsometry:A Novel Detection System for Scanning Near-Field Ellipsometry Microscopy (SNEM)

Peter Manfred Schön (Speaker), D.D. Tranchida (Speaker), In Yee Phang (Speaker), J. Diaz (Speaker), Holger Schönherr (Speaker), Vancso, G. J. (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Santa Barbara, USA
Period29 Jul 2009
Event titleSeeing the Nanoscale VII: null
Event typeConference
LocationSanta Barbara, USA

Keywords

  • METIS-260122