Combining AFM with Ellipsometry:A Novel Detection System for Scanning Near-Field Ellipsometry Microscopy (SNEM)

  • Peter Manfred Schön (Speaker)
  • D.D. Tranchida (Speaker)
  • In Yee Phang (Speaker)
  • J. Diaz (Speaker)
  • Holger Schönherr (Speaker)
  • Vancso, G. J. (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Santa Barbara, USA
Period29 Jul 2009
Event titleSeeing the Nanoscale VII
Event typeConference
LocationSanta Barbara, USAShow on map

Keywords

  • METIS-260122