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Combining AFM with Ellipsometry:A Novel Detection System for Scanning Near-Field Ellipsometry Microscopy (SNEM)
Peter Manfred Schön (Speaker)
D.D. Tranchida (Speaker)
In Yee Phang (Speaker)
J. Diaz (Speaker)
Holger Schönherr (Speaker)
Vancso, G. J.
(Speaker)
Materials Science and Technology of Polymers
Activity
:
Talk or presentation
›
Oral presentation
Description
Plaats van uitgifte: Santa Barbara, USA
Period
29 Jul 2009
Event title
Seeing the Nanoscale VII
Event type
Conference
Location
Santa Barbara, USA
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Keywords
METIS-260122