Confocal reflectrometry - a tool for studying buried films of nanometer thickness

H. Rathgen (Speaker), Mugele, F. G. (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Enschede
Period29 Sep 2005
Event titleMESA+ Day 2005
Event typeConference
LocationEnschede, Netherlands

Keywords

  • METIS-229063