Period | 21 Oct 2019 |
---|---|
Event title | 5th PTB-Seminar 2019: VUV and EUV Metrology |
Event type | Workshop |
Conference number | 5 |
Location | Berlin, Germany |
Degree of Recognition | International |
Damage processes in ruthenium thin films induced by femtosecond laser pulses for a wide range of incident photon energy
Milov, I. (Contributor), Makhotkin, I. A. (Speaker), Nikita Medvedev (Contributor), vladimir lipp (Contributor), B. Ziaja (Contributor), V. Khokhlov (Contributor), V. Zhakhovsky (Contributor), Yu. Petrov (Contributor), V. Shepelev (Contributor), D. Ilnitsky (Contributor), K. Migdal (Contributor), N. Inogamov (Contributor), Eric Louis (Contributor), Bijkerk, F. (Contributor)
Activity: Talk or presentation › Oral presentation