Delay-fault testing in combinational logic circuits

Y. Xing (Speaker)

    Activity: Talk or presentationOral presentation

    Description

    Plaats van uitgifte: Veldhoven
    Period19 Nov 1991
    Event titleIOP/FOM Werkgemeenschap Halfgeleiders 1991
    Event typeConference
    LocationVeldhoven, Netherlands

    Keywords

    • METIS-117344