Detection of aberrant candidate patterns: Improving detection by combining response-pattern and response-time data

S.C. Chuah (Speaker), van der Linden, W. J. (Speaker)

    Activity: Talk or presentationOral presentation

    Description

    Plaats van uitgifte: New York City
    Period25 Mar 2008
    Held atAnnual Meeting of the National Council on Measurement in Education (NCME) 2008
    Event typeConference
    LocationNew York City, United States, New York
    Degree of RecognitionInternational

    Keywords

    • METIS-253110