Detection of aberrant candidate patterns: Improving detection by combining response-pattern and response-time data

S.C. Chuah (Speaker), van der Linden, W. J. (Speaker)

    Activity: Talk or presentationOral presentation

    Description

    Plaats van uitgifte: New York City
    Period25 Mar 2008
    Event titleAnnual Meeting of the National Council on Measurement in Education (NCME) 2008: null
    Event typeConference
    LocationNew York City, United States, New York
    Degree of RecognitionInternational

    Keywords

    • METIS-253110