Detection of aberrant candidate patterns: Improving detection by combining response-pattern and response-time data

    Activity: Talk or presentationOral presentation


    Plaats van uitgifte: New York City
    Period25 Mar 2008
    Event titleAnnual Meeting of the National Council on Measurement in Education (NCME) 2008
    Event typeConference
    OrganiserNational Council on Measurement in Education (NCME)
    LocationNew York City, United States, New YorkShow on map
    Degree of RecognitionInternational


    • METIS-253110