Efficient inspection in semiconductor industry

Willem/Wim Albers (Keynote speaker)

    Activity: Talk or presentationOral presentation

    Description

    Opmerking: Key-note speaker Plaats van uitgifte: Istanbul, Turkey
    Period21 Aug 1997
    Event titleISI-Meeting
    Event typeConference
    LocationIstanbul, Turkey

    Keywords

    • METIS-142470