Ellipsometric characterisation of heterogeneous 2D layers

Wormeester, H. (Speaker), Kooij, E. S. (Speaker), Poelsema, B. (Speaker)

Activity: Talk or presentationOral presentation

Period6 Jul 2003
Held at3rd International Conference on Spectroscopic Ellipsometry, ICSE 2003
Event typeConference
Conference number3
LocationVienna, Austria
Degree of RecognitionInternational

Keywords

  • METIS-214554