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Ellipsometric characterisation of heterogeneous 2D layers
Wormeester, H.
(Speaker)
Kooij, E. S.
(Speaker)
Poelsema, B.
(Speaker)
Physics of Interfaces and Nanomaterials
Activity
:
Talk or presentation
›
Oral presentation
Period
6 Jul 2003
Event title
3rd International Conference on Spectroscopic Ellipsometry, ICSE 2003
Event type
Conference
Conference number
3
Location
Vienna, Austria
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Degree of Recognition
International
Keywords
METIS-214554
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