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Empirical Modeling of Electromigration Early Resistance Changes
J. Niehof (Speaker)
Activity
:
Talk or presentation
›
Oral presentation
Description
Symposium Materials Reliability in Microelectronics III
Period
14 Apr 1993
Event title
MRS Spring Meeting 1993
Event type
Conference
Organiser
Materials Research Society (MRS)
Location
San Fransisco, United States, California
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Degree of Recognition
International
Keywords
METIS-117151
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