Empirical Modeling of Electromigration Early Resistance Changes

J. Niehof (Speaker)

    Activity: Talk or presentationOral presentation

    Description

    Symposium Materials Reliability in Microelectronics III
    Period14 Apr 1993
    Event titleMRS Spring Meeting 1993
    Event typeConference
    LocationSan Fransisco, United States, California
    Degree of RecognitionInternational

    Keywords

    • METIS-117151