Empirical Modeling of Electromigration Early Resistance Changes

  • J. Niehof (Speaker)

    Activity: Talk or presentationOral presentation

    Description

    Symposium Materials Reliability in Microelectronics III
    Period14 Apr 1993
    Event titleMRS Spring Meeting 1993
    Event typeConference
    OrganiserMaterials Research Society (MRS)
    LocationSan Fransisco, United States, California
    Degree of RecognitionInternational

    Keywords

    • METIS-117151