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Fast, Accurate, and Sensitive Carbon Contamination Sensing Using Ellipsometry
Christopher James Lee (Speaker)
Feng Liu (Speaker)
Louis, E.
(Speaker)
Bijkerk, F.
(Speaker)
Laser Physics & Nonlinear Optics
XUV Optics
Activity
:
Talk or presentation
›
Oral presentation
Description
Titelbijdrage: Tertiary Fast, Accurate, and Sensitive Carbon Contamination Sensing Using Ellipsometry Plaats van uitgifte: St. Aubin, France
Period
16 Jul 2012
Event title
SOLEIL 2012 (Carbon contamination of optics: causes, characterization and in-situ treatments): Tertiary Fast, Accurate, and Sensitive Carbon Contamination Sensing Using Ellipsometry
Event type
Conference
Location
St. Aubin, France
Keywords
METIS-298872