Focused ion beam milling of three dimensional nanostructures with high precision

R.W. Tjerkstra (Speaker), Segerink, F. B. (Speaker), J.J. Kelly (Speaker), Vos, W. L. (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Universiteit Twente, Enschede
Period16 May 2008

Keywords

  • METIS-252345