Focused ion beam milling of three dimensional nanostructures with high precision

R.W. Tjerkstra (Speaker), Segerink, F. B. (Contributor), J.J. Kelly (Contributor), Vos, W. L. (Contributor)

Activity: Talk or presentationOral presentation

Period14 Jun 2008
Held at1st International Workshop on FIB for Photonics 2008
Event typeWorkshop
Conference number1
LocationEindhoven, Netherlands
Degree of RecognitionInternational