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Focused ion beam milling of three dimensional nanostructures with high precision

  • R.W. Tjerkstra (Speaker)
  • F.B. Segerink (Contributor)
  • J.J. Kelly (Contributor)
  • Vos, W. L. (Contributor)

Activity: Talk or presentation › Oral presentation

Period14 Jun 2008
Event title1st International Workshop on FIB for Photonics 2008
Event typeWorkshop
Conference number1
LocationEindhoven, NetherlandsShow on map
Degree of RecognitionInternational

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