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High resolution AFM imaging ofion adsorption and charge distribution at solid-liquid interfaces: A deep look into Stern's Layer
Sîretanu, I.
(Speaker), Daniel Ebeling (Speaker), M.P. Andersson (Speaker), Henricus T.M. van den Ende (Speaker),
Mugele, F. G.
(Speaker)
Physics of Complex Fluids
Activity
:
Talk or presentation
›
Oral presentation
Description
Plaats van uitgifte: Tsukuba, Japan
Period
4 Aug 2014
Event title
17th International Conference on Non-Contact Atomic Force Microscopy 2014
Event type
Conference
Conference number
17
Location
Tsukuba, Japan
Keywords
METIS-303879