High resolution AFM imaging ofion adsorption and charge distribution at solid-liquid interfaces: A deep look into Stern's Layer

Sîretanu, I. (Speaker), Daniel Ebeling (Speaker), M.P. Andersson (Speaker), van den Ende, H. T. M. (Speaker), Mugele, F. G. (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Tsukuba, Japan
Period4 Aug 2014
Event title17th International Conference on Non-Contact Atomic Force Microscopy 2014
Event typeConference
Conference number17
LocationTsukuba, Japan

Keywords

  • METIS-303879