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High resolution AFM imaging ofion adsorption and charge distribution at solid-liquid interfaces: A deep look into Stern's Layer
Sîretanu, I.
(Speaker)
Daniel Ebeling (Speaker)
M.P. Andersson (Speaker)
van den Ende, H. T. M.
(Speaker)
Mugele, F. G.
(Speaker)
Physics of Complex Fluids
Activity
:
Talk or presentation
›
Oral presentation
Description
Plaats van uitgifte: Tsukuba, Japan
Period
4 Aug 2014
Event title
17th International Conference on Non-Contact Atomic Force Microscopy 2014
Event type
Conference
Conference number
17
Location
Tsukuba, Japan
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Keywords
METIS-303879
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