High speed atomic force microscopy growth monitoring during pulsed laser deposition

W.A. Wessels (Speaker), Bollmann, T. R. J. (Speaker), A. Ofitserov (Speaker), G. van Baarle (Speaker), Koster, G. (Speaker), Rijnders, A. J. H. M. (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Utrecht
Period28 Oct 2014

Keywords

  • METIS-307214