Keywords
- METIS-307214
High speed atomic force microscopy growth monitoring during pulsed laser deposition
- W.A. Wessels (Speaker)
- Bollmann, T. R. J. (Speaker)
- A. Ofitserov (Speaker)
- G. van Baarle (Speaker)
- Koster, G. (Speaker)
- Rijnders, A. J. H. M. (Speaker)
Activity: Talk or presentation › Oral presentation