Improved resolution for x-ray spectroscopy: single order operation of lamellar multilayer gratings

R. van der Meer (Speaker), I.V. Kozhevnikov (Speaker), B. Krishnan (Speaker), Huskens, J. (Speaker), M.J. de Boer (Speaker), P.E. Hegeman (Speaker), G.C.S. Brons (Speaker), Bastiaens, H. M. J. (Speaker), Boller, K. (Speaker), Bijkerk, F. (Speaker)