Improved resolution for x-ray spectroscopy: single order operation of lamellar multilayer gratings

R. van der Meer (Speaker), I.V. Kozhevnikov (Speaker), B. Krishnan (Speaker), Huskens, J. (Speaker), M.J. de Boer (Speaker), P.E. Hegeman (Speaker), G.C.S. Brons (Speaker), Bastiaens, H. M. J. (Speaker), Boller, K. (Speaker), Bijkerk, F. (Speaker)

Activity: Talk or presentationOral presentation

Period27 Feb 2012
Held at8th EOS Topical Meeting on Diffractive Optics, DO 2012
Event typeConference
Conference number8
LocationDelft, Netherlands
Degree of RecognitionInternational