In-situ optical metrology for ion induced roughening of Ag(001)

F. Everts (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Leiden, the Netherlands
Period4 Mar 2008
Event titleNanoNed - Nano Electronic Materials flagship meeting 2008
Event typeConference
LocationLeiden, Netherlands

Keywords

  • METIS-250783