In-situ optical metrology for ion induced roughening of Ag(001)

  • F. Everts (Speaker)

Activity: Talk or presentation › Oral presentation

Description

Plaats van uitgifte: Veldhoven, the Netherlands
Period23 Jan 2008
Event titlePhysics@FOM Veldhoven 2008
Event typeConference
LocationVeldhoven, NetherlandsShow on map

Keywords

  • METIS-250782