In-situ optical metrology for ion induced roughening of Ag(001)

F. Everts (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Veldhoven, the Netherlands
Period23 Jan 2008
Held atPhysics@FOM Veldhoven 2008
Event typeConference
LocationVeldhoven, Netherlands

Keywords

  • METIS-250782