In situ PFM Characterization of Ferroelectric Thin Films

B.F. Smith (Speaker), David H.A. Blank (Speaker), Rijnders, A. J. H. M. (Speaker), ten Elshof, J. E. (Speaker), Koster, G. (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Boston, USA
Period30 Nov 2010
Event titleMRS Fall Meeting 2010
Event typeConference
LocationBoston, United States, Massachusetts

Keywords

  • METIS-269870