Insitu Stress Measurement of Thin Film and Multilayer Deposition

Johan Reinink (Speaker), van de Kruijs, R. W. E. (Contributor), Bijkerk, F. (Contributor)

Activity: Talk or presentationOral presentation

Period3 Oct 2016
Event titleStress evolution in thin films and coatings: null
Event typeConference
LocationO'Hare-Rosemont, United States, Illinois