Integrated correlative Raman Microscope - FIB - SEM

  • F.J. Timmermans (Speaker)
  • A.T.M. Lenferink (Speaker)
  • H.A.G.M. van Wolferen (Speaker)
  • Otto, C. (Speaker)

Activity: Talk or presentation › Oral presentation

Period31 Mar 2015
Event titleFocus on Microscopy, FOM 2015
Event typeConference
LocationGöttingen, Germany, Lower SaxonyShow on map
Degree of RecognitionInternational

Keywords

  • Integrated correlative light and electron microscopy
  • Raman microscopy
  • FIB – SEM

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