Integrated correlative Raman Microscope - FIB - SEM

F.J. Timmermans (Speaker), A.T.M. Lenferink (Speaker), van Wolferen, H. A. G. M. (Speaker), Otto, C. (Speaker)

Activity: Talk or presentationOral presentation

Period31 Mar 2015
Event titleFocus on Microscopy, FOM 2015: null
Event typeConference
LocationGöttingen, Germany, Lower Saxony
Degree of RecognitionInternational

Keywords

  • Integrated correlative light and electron microscopy
  • Raman microscopy
  • FIB – SEM