Metal-on-metal interface formation laws of nanoscale thin films

Chandrasekaran, A. (Speaker), van de Kruijs, R. W. E. (Contributor), Sturm, J. M. (Contributor), Bijkerk, F. (Contributor)

Activity: Talk or presentationInvited talk


In thin film-based devices, there is a constant effort to prevent or at least limit interlayer formation between the layers. Interface effects become much more critical especially in the case of nanoscale thin film systems.
Period7 Nov 2018
Event titlePhysics of X-Ray and Neutron Multilayer Structures, PXRNMS2018: null
Event typeWorkshop
LocationParis, France
Degree of RecognitionInternational