Micromachined AFM probes: from single tips towards tip-arrays for data storage

J.P. Brugger (Keynote speaker)

    Activity: Talk or presentationOral presentation

    Description

    Opmerking: Key-note speaker Plaats van uitgifte: Ameland, Nederland
    Period17 Jun 1999
    Event titleAIO-Workshop Scanning Probe Techniques 1999
    Event typeConference
    LocationHollum, Ameland, Netherlands

    Keywords

    • METIS-116338