Model independent approach for the analysis of GIXR data from thin films

I.A. Makhotkin (Contributor)
S.N. Yakunin (Speaker)
J.F. Woitok (Contributor)
van de Kruijs, R. W. E. (Contributor)
E. Reuvekamp (Contributor)
Bijkerk, F. (Contributor)

XUV Optics

Activity: Talk or presentation › Oral presentation

Description

The main limitation in the analysis of thin films by means of grazing incidence X-ray reflectivity (GIXR) technique is that direct reconstruction of their optical constant profile from measured data is impossible because the phase of reflection is not known and the limited measurement range.

Period	23 May 2017
Event title	Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017
Event type	Conference
Location	Strasbourg, FranceShow on map
Degree of Recognition	International

Documents & Links

Makhotkin_2017_model
File: application/pdf, 71.6 KB
Type: Text
Malhotkin_2017_conference-program
File: application/pdf, 120 KB
Type: Text