Model independent approach for the analysis of GIXR data from thin films

Makhotkin, I. A. (Contributor), S.N. Yakunin (Speaker), J.F. Woitok (Contributor), van de Kruijs, R. W. E. (Contributor), E. Reuvekamp (Contributor), Bijkerk, F. (Contributor)

Activity: Talk or presentationOral presentation


The main limitation in the analysis of thin films by means of grazing incidence X-ray reflectivity (GIXR) technique is that direct reconstruction of their optical constant profile from measured data is impossible because the phase of reflection is not known and the limited measurement range.
Period23 May 2017
Event titleSymposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017: null
Event typeConference
LocationStrasbourg, France
Degree of RecognitionInternational