Model independent approach for the analysis of GIXR data from thin films

Makhotkin, I. A. (Contributor), S.N. Yakunin (Speaker), J.F. Woitok (Contributor), van de Kruijs, R. W. E. (Contributor), E. Reuvekamp (Contributor), Bijkerk, F. (Contributor)

Activity: Talk or presentationOral presentation

Description

The main limitation in the analysis of thin films by means of grazing incidence X-ray reflectivity (GIXR) technique is that direct reconstruction of their optical constant profile from measured data is impossible because the phase of reflection is not known and the limited measurement range.
Period23 May 2017
Held atSymposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017
Event typeConference
LocationStrasbourg, France
Degree of RecognitionInternational