Monitoring oxide thin film grown with in-situ scanning force microscopy

Activity: Talk or presentation › Invited talk

Period16 Sept 2008
Event title15th International Workshop on Oxide Electronics, iWOE 2008
Event typeConference
Conference number15
LocationEstes Park, United States, ColoradoShow on map
Degree of RecognitionInternational

Keywords

  • METIS-252401

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