Monitoring oxide thin film grown with in-situ scanning force microscopy

Rijnders, G. (Speaker)

Activity: Talk or presentationInvited talk

Period16 Sep 2008
Held at15th International Workshop on Oxide Electronics, iWOE 2008
Event typeConference
Conference number15
LocationEstes Park, United States, Colorado
Degree of RecognitionInternational

Keywords

  • METIS-252401