Monitoring oxide thin film growth with in-situ atomic force microscoy

Broekmaat, J. J. (Speaker), F.J.G. Roesthuis (Speaker), Brinkman, A. (Speaker), Horst Rogalla (Speaker), David H.A. Blank (Speaker), Rijnders, A. J. H. M. (Speaker)

Activity: Talk or presentationOral presentation


Plaats van uitgifte: Boston, USA
Period28 Nov 2006
Event titleMRS Fall meeting, Symposium S on Organic Eelctronics - Materials, Devices and Applications: null
Event typeConference
LocationBoston, USA, United States


  • METIS-236609