Monitoring Oxide Thin Film Growth with In-situ Atomic Force Microscopy

Rijnders, A. J. H. M. (Speaker), Broekmaat, J. J. (Speaker), David H.A. Blank (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Boston, USA
Period4 Dec 2008
Event titleMRS Fall Meeting 2008
Event typeConference
LocationBoston, United States, Massachusetts

Keywords

  • METIS-252420