Skip to main navigation
Skip to search
Skip to main content
University of Twente Research Information Home
Home
Profiles
Research units
Projects
Research output
Datasets
Activities
Prizes
Press/Media
Search by expertise, name or affiliation
Monitoring Oxide Thin Film Growth with In-situ Atomic Force Microscopy
Rijnders, A. J. H. M.
(Speaker)
Joska Johannes Broekmaat (Speaker)
David H.A. Blank (Speaker)
Inorganic Materials Science
Activity
:
Talk or presentation
›
Oral presentation
Description
Plaats van uitgifte: Boston, USA
Period
4 Dec 2008
Event title
MRS Fall Meeting 2008
Event type
Conference
Location
Boston, United States, Massachusetts
Show on map
Keywords
METIS-252420
X