Monitoring oxide thin film growth with in-situ atomic force microscopy

Broekmaat, J. J. (Speaker), F.J.G. Roesthuis (Speaker), Brinkman, A. (Speaker), Horst Rogalla (Speaker), David H.A. Blank (Speaker), Rijnders, A. J. H. M. (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Sapporo, Japan
Period4 Sep 2006

Keywords

  • METIS-236598