MOSFET hot-carrier-induced degradation - models, characterization techniques and applications in reliability engineering

M.M. Lunenborg (Invited speaker)

    Activity: Talk or presentationOral presentation

    Description

    Opmerking: Invited Plaats van uitgifte: Nijmegen
    Period21 May 1996
    Event titleMeeting Philips Semiconductors 1996: null
    Event typeConference
    LocationNijmegen, Netherlands

    Keywords

    • METIS-116267