MS-Testing: The Gap between Industrial Problems and Academic Solutions

Kerkhoff, H. G. (Speaker)

    Activity: Talk or presentationOral presentation

    Description

    Plaats van uitgifte: Seville, Spain
    Period1 Jun 2003
    Event title2003 IEEE 9th International Mixed-Signal Testing Workshop, IMSTW 2003
    Event typeWorkshop
    Conference number9
    LocationSeville, Spain

    Keywords

    • METIS-214913