Numerical analyses of the influence of waviness on the film thickness of a circular EHL contact

Venner, C. H. (Keynote speaker)

Activity: Talk or presentationOral presentation

Period8 Oct 1995
Held atASME/STLE Tribology Conference 1995
Event typeConference
LocationOrlando, United States, Florida
Degree of RecognitionInternational

Keywords

  • METIS-147286