Numerical analyses of the influence of waviness on the film thickness of a circular EHL contact

Venner, C. H. (Keynote speaker)

    Activity: Talk or presentationOral presentation

    Period8 Oct 1995
    Event titleASME/STLE Tribology Conference 1995
    Event typeConference
    LocationOrlando, United States, Florida
    Degree of RecognitionInternational

    Keywords

    • METIS-147286