Prediction of film thickness decay in EHL contacts using a thin layer flow model

M.T. van Zoelen (Speaker), Venner, C. H. (Speaker), Lugt, P. M. (Speaker)

Activity: Talk or presentationOral presentation

Description

15 sheets
Period11 Sep 2008
Held at35th Leeds-Lyon Symposium on Tribology 2008
Event typeConference
Conference number35
LocationLeeds, United Kingdom
Degree of RecognitionInternational

Keywords

  • METIS-254681