Reduction of 1/f Noise in MOSFETs by Switched Bias Techniques

A.P. van der Wel (Speaker)

    Activity: Talk or presentationOral presentation

    Description

    Plaats van uitgifte: Utrecht, The Netherlands
    Period2 Jan 2001
    Event titleSTW Gebruikersvergadering 2001
    Event typeConference
    LocationUtrecht, Netherlands

    Keywords

    • METIS-204128