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Scanning Probe Microscopy
J.P. Brugger (Keynote speaker), B.J. Kim (Keynote speaker)
Activity
:
Talk or presentation
›
Oral presentation
Description
Opmerking: Key-note speaker Plaats van uitgifte: Heidelberg, Germany
Period
28 May 2000
Event title
EMBL Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures 2000
Event type
Conference
Location
Heidelberg, Germany, Baden-Württemberg
Keywords
METIS-116320