Signatures of induced superconductivity in a p-n heterostructure comprised of Sb2Te3 and Bi2Te3 3D topological insulator thin films with in situ Al capping

Peter Schüffelgen (Speaker), Daniel Rosenbach (Contributor), Martin Lanius (Contributor), Jörn Kampmeier (Contributor), Gregor Mussler (Contributor), Markus Eschbach (Contributor), Ewa Mlynczak (Contributor), L.ukasz Plucinski (Contributor), Martina Luysberg (Contributor), Stefan Trellenkamp (Speaker), Martin Stehno (Contributor), Prosper Ngabonziza (Contributor), Brinkman, A. (Contributor), Yuan Pang (Contributor), Li Lu (Contributor), Thomas Schäpers (Contributor), Detlev Grützmacher (Contributor)

Activity: Talk or presentationOral presentation

Description

We investigate the transport properties of Sb2Te3/Bi2Te3 p-n heterostructure topological insulator film-superconductor junctions. The films are grown by means of molecular beam epitaxy on a Si (111) substrate and capped in-situ by a thin layer of aluminum to prevent thin film degradation and to preserve the Dirac-like surface states. Josephson junctions are defined by depositing two niobium electrodes, separated by a few tens of nanometers, onto the Sb2Te3/Bi2Te3 layer. The transport measurements at cryogenic temperatures showed signatures of Andreev reflections and Josephson supercurrents. For wider junctions a Fraunhofer pattern was observed for the critical current, whereas for the narrow junctions a monotonous decrease was found.
Period11 Mar 2016
Held atDPG Frühjahrstagung 2016 Regensburg
Event typeConference
LocationRegensburg, Germany
Degree of RecognitionInternational