Single-shot damage of Ru thin film induced by XUV FEL fs pulses

Milov, I. (Speaker), Makhotkin, I. A. (Contributor), R. Sobierajski (Contributor), H. Enkisch (Contributor), Jaromir Chalupsky (Contributor), K. Tiedtke (Contributor), Gosse de Vries (Contributor), M. Störmer (Contributor), Frank Scholze (Contributor), F. Siewert (Contributor), van de Kruijs, R. W. E. (Contributor), R. Keim (Contributor), H.A.G.M. van Wolferen (Contributor), Louis, E. (Contributor), I. Yatsyna (Contributor), M. Jurek (Contributor), L. Juha (Contributor), V. Hájková (Contributor), V. Vozda (Contributor), T. Burian (Contributor), K. Saksl (Contributor), B. Faatz (Contributor), B. Keitel (Contributor), E. Ploenjes (Contributor), S. Schreiber (Contributor), S. Toleikis (Contributor), R. Loch (Contributor), M. Hermann (Contributor), S. Strobel (Contributor), H. Nienhuys (Contributor), G. Gwalt (Contributor), Tobias Mey (Contributor), Klaus Man (Contributor)

Activity: Talk or presentationInvited talk

Period24 Apr 2017
Event titleSPIE Optics + Optoelectronics 2017
Event typeConference
LocationPrague, Czech Republic
Degree of RecognitionInternational