Spectroscopic ellipsometry: A versatile technique to characterize surfaces and thin films

Kooij, E. S. (Speaker)

Activity: Talk or presentationOral presentation

Description

Plaats van uitgifte: Texel, the Netherlands
Period19 Jun 2006
Event titleBioPolySurf summer school: Surface Engineering and Fundamentals of Physical Techniques for their Characterization: null
Event typeConference
LocationTexel, the Netherlands

Keywords

  • METIS-235971