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Spectroscopic ellipsometry: A versatile technique to characterize surfaces and thin films
Kooij, E. S.
(Speaker)
Physics of Interfaces and Nanomaterials
Activity
:
Talk or presentation
›
Oral presentation
Description
Plaats van uitgifte: Texel, the Netherlands
Period
19 Jun 2006
Event title
BioPolySurf summer school: Surface Engineering and Fundamentals of Physical Techniques for their Characterization
Event type
Conference
Location
Texel, the Netherlands
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Keywords
METIS-235971
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