Surface defects of clay nano-particles probed by atomic force microscope

Aram Harold Klaassen (Speaker), Sîretanu, I. (Speaker), van den Ende, H. T. M. (Speaker), Mugele, F. G. (Speaker)

Activity: Talk or presentation › Oral presentation

Description

Plaats van uitgifte: Madrid Spain
Period30 Mar 2016
Event titleSixth multifrequency AFM conference: null
Event typeConference
LocationMadrid Spain

Keywords

  • METIS-319953