Surface Ellipsometry of the Si(100)2x1 surface using a Full Microscopic Model

  • Christianus M.J. Wijers (Speaker)

Activity: Talk or presentation › Oral presentation

Description

Plaats van uitgifte: Parijs, Frankrijk
Period11 Jan 1993
Event title1st International Conference on Spectroscopic Ellipsometry, ICSE 1993
Event typeConference
Conference number1
LocationParis, FranceShow on map

Keywords

  • METIS-133003