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Surface Ellipsometry of the Si(100)2x1 surface using a Full Microscopic Model
Christianus M.J. Wijers (Speaker)
Physics of Interfaces and Nanomaterials
Activity
:
Talk or presentation
›
Oral presentation
Description
Plaats van uitgifte: Parijs, Frankrijk
Period
11 Jan 1993
Event title
1st International Conference on Spectroscopic Ellipsometry, ICSE 1993
Event type
Conference
Conference number
1
Location
Paris, France
Keywords
METIS-133003