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Testable Design for MEMS Sensors

  • Hans G. Kerkhoff (Speaker)

Activity: Talk or presentation › Oral presentation

Period1 Nov 2005
Event title4th IEEE Conference on Sensors 2005
Event typeConference
Conference number4
LocationIrvine, United States, CaliforniaShow on map
Degree of RecognitionInternational

Keywords

  • METIS-226951