The maximum entropy method compared to multipolar refinement in BE and SI

R.Y. de Vries (Invited speaker), Briels, W. J. (Invited speaker), D. Feil (Invited speaker)

    Activity: Talk or presentationOral presentation

    Period8 Aug 1996
    Event title17th Congress and General Assembly of the International Union of Crystallography 1996
    Event typeConference
    Conference number17
    LocationSeattle, United States, Washington
    Degree of RecognitionInternational