The maximum entropy method compared to multipolar refinement in BE and SI

R.Y. de Vries (Invited speaker), Briels, W. J. (Invited speaker), D. Feil (Invited speaker)

    Activity: Talk or presentationOral presentation

    Period8 Aug 1996
    Event title17th Congress and General Assembly of the International Union of Crystallography 1996: null
    Event typeConference
    Conference number17
    LocationSeattle, United States, Washington
    Degree of RecognitionInternational